SN74LVTH18646APM
manufacturer:
Texas Instruments
Description:
IC SCAN-TEST-DEV/XCVR 64-LQFP
Category:
Integrated Circuits (ICs)
Specifications
Category:
Integrated Circuits (ICs)
Logic
Specialty Logic
Number Of Bits:
18
Product Status:
Active
Mounting Type:
Surface Mount
Package:
Tray
Series:
74LVTH
Logic Type:
ABT Scan Test Device With Transceivers And Registers
Supplier Device Package:
64-LQFP (10x10)
Mfr:
Texas Instruments
Operating Temperature:
-40°C ~ 85°C
Supply Voltage:
2.7V ~ 3.6V
Package / Case:
64-LQFP
Base Product Number:
74LVTH18646
Introduction
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10)
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