SN74BCT8374ADW
manufacturer:
Texas Instruments
Description:
IC SCAN TEST DEVICE W/FF 24-SOIC
Category:
Integrated Circuits (ICs)
Specifications
Category:
Integrated Circuits (ICs)
Logic
Specialty Logic
Number Of Bits:
8
Product Status:
Active
Mounting Type:
Surface Mount
Package:
Tube
Series:
74BCT
Logic Type:
Scan Test Device With D-Type Edge-Triggered Flip-Flops
Supplier Device Package:
24-SOIC
Mfr:
Texas Instruments
Operating Temperature:
0°C ~ 70°C
Supply Voltage:
4.5V ~ 5.5V
Package / Case:
24-SOIC (0.295", 7.50mm Width)
Base Product Number:
74BCT8374
Introduction
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
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