SN74ABT8952DW
manufacturer:
Texas Instruments
Description:
IC SCAN-TEST-DEV/XCVR 28-SOIC
Category:
Integrated Circuits (ICs)
Specifications
Category:
Integrated Circuits (ICs)
Logic
Specialty Logic
Number Of Bits:
8
Product Status:
Obsolete
Mounting Type:
Surface Mount
Package:
Tube
Series:
74ABT
Logic Type:
Scan Test Device With Registered Bus Transceiver
Supplier Device Package:
28-SOIC
Mfr:
Texas Instruments
Operating Temperature:
-40°C ~ 85°C
Supply Voltage:
4.5V ~ 5.5V
Package / Case:
28-SOIC (0.295", 7.50mm Width)
Base Product Number:
74ABT8952
Introduction
Scan Test Device with Registered Bus Transceiver IC 28-SOIC
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